Analysis of Plane Wave Scattering by a Conducting Thin Plate and a Criterion for Ray Tracing Method

Kazunori UCHIDA  Tetsuro IMAI  Teruya FUJII  Masaharu HATA  

IEICE TRANSACTIONS on Electronics   Vol.E81-C   No.4   pp.618-621
Publication Date: 1998/04/25
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: LETTER
Category: Electromagnetic Theory
Wiener-Hopf technique,  near and far fields,  ray tracing method,  

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This paper presents almost rigorous Wiener-Hopf solutions to the plane wave scattering by a conducting finite thin plate. The final field expressions are given in an analytically compact form and the results are accurate as long as the plate width is greater than the wavelength. Numerical examples are given for the near and far field distributions. A criterion is also proposed to estimate under what condition the ray tracing method holds.