For Full-Text PDF, please login, if you are a member of IEICE,|
or go to Pay Per View on menu list, if you are a nonmember of IEICE.
A High-Resolution Measurement System for Surface Profile of Electric Contact
Yasuo EBARA Hideaki SONE Yoshiaki NEMOTO Tasuku TAKAGI
IEICE TRANSACTIONS on Electronics
Publication Date: 1998/03/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section LETTER (Special Issue on Electromechanical Devices and their Surface Science)
electric contact, surface profile measurement, focal length, high-resolution,
Full Text: PDF>>
We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [µm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.