Single-Electron Circuit Simulation

Shuhei AMAKAWA  Hideaki MAJIMA  Hironobu FUKUI  Minoru FUJISHIMA  Koichiro HOH  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E81-C   No.1   pp.21-29
Publication Date: 1998/01/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Technology Challenges for Single Electron Devices)
Category: 
Keyword: 
Coulomb blockade of tunneling,  master equation,  Monte Carlo method,  SET,  SPICE,  

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Summary: 
Various techniques of single-electron circuit simulation are presented. The subjects include visualization of state probabilities, accurate yet reasonably fast steady-state analysis and SPICE-based high-speed simulation for circuits composed of Single-Electron Transistors (SETs). The visualized state probabilities allow one to grasp the dynamics of a single-electron circuit intuitively. The new algorithm for steady-state analysis uses the master equation and Monte Carlo method in combination. We suppose this is the best way to perform steady-state analysis. The SPICE-based simulator significantly outperforms the conventional reference simulator in speed. It is, to the best of our knowledge, the only simulator that can simulate SET circuits for real applications. It also facilitates the study of the integration of SETs and MOSFETs.