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Module Selection Using Manufacturing Information
Hiroyuki TOMIYAMA Hiroto YASUURA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1998/12/25
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-level Synthesis
high-level synthesis, module selection, manufacturability, yield,
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Since manufacturing processes inherently fluctuate, LSI chips which are produced from the same design have different propagation delays. However, the difference in delays caused by the process fluctuation has rarely been considered in most of existing high-level synthesis systems. This paper presents a new approach to module selection in high-level synthesis, which exploits the difference in functional unit delays. First, a module library model which assumes the probabilistic nature of functional unit delays is presented. Then, we propose a module selection problem and an algorithm which minimizes the cost per faultless chip. Experimental results demonstrate that the proposed algorithm finds optimal module selections which would not have been explored without manufacturing information.