Complex Permittivity Measurement at Pseudo Microwave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator

Akira NAKAYAMA  Atsuomi FUKUURA  Michiaki NISHIMURA  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E80-C   No.8   pp.1117-1125
Publication Date: 1997/08/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
permittivity measurement,  pseudo microwave,  cavity resonator,  dielectric substrate,  

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Summary: 
This paper describes a nondestructive measurement method for complex permittivity of dielectric plates at 2 GHz, using a cylindrical cavity resonator. The resonator is divided into two parts at the center. Two dielectric plates are symmetrically loaded around the center of the cavity. These plates have high permittivity of 45. A dielectric plate specimen is clamped with these halves. The values of relative permittivity ε and loss tangent tanδ of the specimen are obtained from the resonant frequency and unloaded Q-value of TE011 mode. Measured results of various materials are compared with those values obtained at 3 and 10 GHz by other cavity resonator method. An edge effect is taken into account by a reference method, using measurement data of a sapphire plate. The errors of the present method are smaller than 1% and 2-310-5 for ε and tanδ, respectively.