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Surface Tunnel Transistors with Multiple Interband Tunnel Junctions
Toshio BABA Tetsuya UEMURA
IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on New Concept Device and Novel Architecture LSIs)
Category: Quantum Devices
tunnel transistor, interband tunneling, negative differential resistance, functional circuit, multiple value,
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New functional surface tunnel transistors (STTs) with multiple interband-tunnel-junctions in a symmetric source-to-drain structure are proposed to reduce the number of fabrication steps and to increase functionality. These devices have p+/n+ interband tunnel junctions in series between a p+ source and a p+ drain through n+ channels. We successfully fabricated GaAs-based multiple-junction STTs (MJ-STTs) using molecular-beam epitaxy regrowth. This fabrication method eliminates the need for two of the photo-masks in the conventional process for asymmetric planar STTs. In the preliminary experiments using multiple-junction p+/n+ diodes, we found that the peak-voltage increment in negative-differential-resistance (NDR) characteristics due to the reverse-biased tunnel junction in negligible, while the first-peak voltage is roughly proportional to the number of forward-biased tunnel junctions. Moreover, the number of NDR characteristics are completely determined by the number of tunnel junctions. The fabricated STTs with multiple junctions, up to eight junctions, exhibited clear transistor operation with multiple NDR characteristics, which were symmetric with the drain bias. These results indicate that any number of gate-controlled NDR characteristics can be realized in MJ-STTs by using an appropriate number of tunnel junctions in series. In addition, as an example of a functional circuit using MJ-STTs, we implemented a tri-stable circuit with a four-junction STT and a load resistor connected in series. The tri-stable operation was confirmed by applying a combination of a reset pulse and a set pulse for each stable point.