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Power Heterojunction FET with High Breakdown Voltage for X- and Ku-Band Applications
Yasuhiro OKAMOTO Kohji MATSUNAGA Mikio KANAMORI Masaaki KUZUHARA Yoichiro TAKAYAMA
IEICE TRANSACTIONS on Electronics
Publication Date: 1997/06/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeterwave High-power Devices)
heterojunction FET, high breakdown voltage, buried gate,
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A buried gate AlGaAs/InGaAs heterojunction FET (HJFET) with gate breakdown voltage of 30 V was examined for high drain bias (higher than 10 V) operation. High breakdown voltage was realized due to the optimization of the narrow recess depth. A 1.4 mm HJFET has exhibited an output power of 30.2 dBm (1050 mW) with 50% power added efficiency (PAE) and 12.1 dB linear gain at 12 GHz with a 13 V drain bias. An internal matching circuit for a 16.8 mm HJFET was designed using a large-signal load impedance determined from load-pull measurement. The 16.8 mm internally-matched HJFET has delivered 38.9 dBm (7.8 W) output power with 46% PAE and 11.6 dB linear gain at 12 GHz with a drain bias of 13 V. This is the first report of higher than 10 V operation of an X- and Ku-band power HJFET with the excellent power performance.