Studies on the Characterization and Optimal Design of E-Plane Waveguide Bends

Zhewang MA  Taku YAMANE  Eikichi YAMASHITA  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E80-C   No.11   pp.1395-1401
Publication Date: 1997/11/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Electromagnetic TheoryScattering and Diffraction)
Category: 
Keyword: 
E-plane waveguide bend,  mode-matching method,  port reflection coefficient method,  full-band matching,  

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Summary: 
Characterization of a mitered, a squarely cut, and a circular E-plane bend in rectangular waveguide is implemented by combining the port reflection coefficient method and the mode-matching method. Based on the port reflection coefficient method, the two-port waveguide bend is converted to a one-port structure comprised of cascaded waveguide step-junctions. After solving the reflection coefficient caused by these waveguide step-junctions using the mode-matching method, the desired scattering parameters of the bend are obtained readily. Convergence properties of the calculated numerical results are validated. Influences of the mitered, the squarely cut, and the circular part of the bend on the scattering parameters are investigated, and the optimal design dimensions for realizing wide-band and low return loss bends are found. Based on the optimal compensation dimension, an E-plane waveguide circular bend is fabricated and tested. The measured result agrees well with the theoretical prediction, and a full-band matched bend is practically realized.