Efficient Characterization of Complex H-Plane Waveguide π-Junction and Cross-Junctions*

Zhewang MA

IEICE TRANSACTIONS on Electronics   Vol.E79-C    No.3    pp.444-452
Publication Date: 1996/03/25
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Microwave and Millimeter Wave Technology
waveguide π-junction,  asymmetrical cross-junction,  port reflection coefficient method (PRCM),  mode-matching technique,scattering characteristics,  

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An efficient full-wave approach for the accurate characterization of a H-plane waveguide π-junction with an inductive post and a waveguide cross-junction is proposed. By employing the port reflection coefficient method (PRCM), the analysis and solution procedures of these complex waveguide junctions are greatly simplified and only the calculation of field reflections caused by the simplest waveguide step-junction discontinuities are required. The reflections are easily determined by the mode-matching technique. Scattering parameters of these junctions are provided and discussed in terms of the working frequency and the geometrical dimensions of the junctions. Calculated results are compared with those of other papers and measurements, all show good agreement.