Water Vapor Density Measurement in Halogen Lamps Using Near-Infrared Semiconductor Laser Spectrometry I--Working Curve Measurement--

Takayuki SUZUKI  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E79-C   No.12   pp.1769-1771
Publication Date: 1996/12/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: LETTER
Category: Opto-Electronics
Keyword: 
InGaAsP/InP semiconductor laser,  halogen lamp,  non-destructive measurement,  quantitative analysis,  laser spectrometry,  

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Summary: 
Preliminary experiments on non-destructive quantitative analysis of water vapor density in halogen lamps have been carried out. A working curve showing a relation between absorbance and water vapor density was successfully obtained by using frequency-stabilized InGaAsP/InP semiconductor laser spectrometric system.