Testing of k-FR Circuits under Highly Observable Condition

Xiaoqing WEN  Hideo TAMAMOTO  Kozo KINOSHITA  

IEICE TRANSACTIONS on Information and Systems   Vol.E78-D   No.7   pp.830-838
Publication Date: 1995/07/25
Online ISSN: 
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
testable design,  fault testing,  highly observable condition,  circuit conversion,  

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This paper presents the concept of k-FR circuits. The controllability of such a circuit is high due to its special structure. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k1)1 test vectors under the highly observable condition which assumes the output of every gate to be observable. k is usually two or three. This paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit. A k-FR circuit is easy to test when using technologies such as the electron-beam probing, the current measurement, or the CrossCheck testability solution.