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A New Conformance Testing Technique for Localization of Multiple Faults in Communication Protocols
Yoshiaki KAKUDA Hideki YUKITOMO Shinji KUSUMOTO Tohru KIKUNO
IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
software testing, communication protocol, conformance testing, fault localization, test sequence,
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Conformance testing techniques are required for the efficient production of reliable communication protocols. A lot of conformance testing techniques have been developed. However, most of them can only decide whether an implemented protocol conforms to its specification. That is, the exact locations of faults are not determined by them. This paper presents some conditions that enable to find locations of multiple faults, and then proposes a test sequence generation technique under such conditions. The correctness proof and complexity analysis of the proposed technique are also given. The characteristics of this technique are to generate test sequences based on protocol specifications and interim test results, and to find locations of multiple faults in protocol implementations. Although the length of the test sequence generated by the proposed technique is a little longer than the one generated by the previous one, the class to which the proposed technique can be applied is larger than that to which the previous one can be applied.