A 6-ns 4-Mb CMOS SRAM with Offset-Voltage-Insensitive Current Sense Amplifiers

Koichiro ISHIBASHI  Koichi TAKASUGI  Kunihiro KOMIYAJI  Hiroshi TOYOSHIMA  Toshiaki YAMANAKA  Akira FUKAMI  Naotaka HASHIMOTO  Nagatoshi OHKI  Akihiro SHIMIZU  Takashi HASHIMOTO  Takahiro NAGANO  Takashi NISHIDA  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E78-C   No.6   pp.728-734
Publication Date: 1995/06/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on the 1994 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol. 30, No. 4 April 1995))
Category: 
Keyword: 


Full Text: PDF>>
Buy this Article




Summary: 
A 4-Mb CMOS SRAM with 3.84 µm2 TFT load cells is fabricated using 0.25-µm CMOS technology and achieves an address access time of 6 ns at a supply voltage of 2.7 V. The use of a current sense amplifier that is insensitive to its offset voltage enables the fast access time. A boosted cell array architecture allows low voltage operation of fast SRAM's using TFT load cells.