For Full-Text PDF, please login, if you are a member of IEICE,|
or go to Pay Per View on menu list, if you are a nonmember of IEICE.
Relative Intensity Noise of DFB LD's with Near and Far End Reflections
Takeshi KAWAI Adi RAHWANTO Katsuya KITAJIMA Masakazu MORI Toshio GOTO Akira MIYAUCHI
IEICE TRANSACTIONS on Electronics
Publication Date: 1995/12/25
Print ISSN: 0916-8516
Type of Manuscript: PAPER
near end reflection, far end reflection, RIN, optoelectronics,
Full Text: PDF(675.2KB)>>
The relative intensity noise (RIN) spectra of DC driven 1.3 µm distributed feedback laser diodes under the influence of external reflections are measured for various currents and reflection lengths. The effective power reflectivities are 310-4-310-3. The enhanced noise is observed when the relaxation oscillation frequency coincides with the external cavity frequency. It is also observed that the RIN spectra with the near end reflections differ from those with the far end reflections. The degradation of the RIN spectra is analyzed with the rate equations numerically. A new reflection noise model, which includes the carrier density change induced by the reflections, is introduced. The near and far end reflections are characterized well by this model. Furthermore, it is found that the reflection induced noise effect can be described well by the far end reflection noise model even when the reflection length is as short as 1 m.