Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures

Toshifumi OHKUBO  Yasushi MAEDA  Yasuhiro KOSHIMOTO  

IEICE TRANSACTIONS on Electronics   Vol.E78-C   No.11   pp.1523-1529
Publication Date: 1995/11/25
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Ultra High Density Information Storage Technologies)
Co-Cr film,  compositional separation,  magnetic domain configuration,  magnetic force microscopy,  magnetic recording,  perpendicular recording,  

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A soft magnetic force microscope (MFM) tip was used to evaluate the magnetic recording characteristics of compositionally separated Co-Cr perpendicular media. Small magnetic bits were recorded on thick (350 nm). and thin (100 nm) films, focusing on the fineness of compositionally separated microstructures. MFM images showed bit marks 230 and 150 nm in diameter, measured at full-width at half maximum (FWHM) for the thick and thin films, respectively. These results verify that the recordable bit size can be decreased by using a thinner film with a finer compositionally separated microstructure. Simulation was used to clarify the relationship between the actual sizes of the recorded bits and the sizes of their MFM images. The recorded bit size was found to closely correspond to the FWHM of the MFM bit images.