Model-Adaptable Parameter Extraction System for MOSFET Models

Masaki KONDO  Takashi MORIE  Hidetoshi ONODERA  Keikichi TAMARU  

IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E78-A   No.5   pp.569-572
Publication Date: 1995/05/25
Online ISSN: 
Print ISSN: 0916-8508
Type of Manuscript: Special Section LETTER (Special Section of Letters Selected from the 1994 IEICE Fall Conference)
parameter extraction system,  initial value estimation,  MOSFET characterization,  

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This paper describes a parameter extraction system that can easily accommodate many MOSFET models. The model-adaptability is contributed by tow factors; a model-adaptable initial value estimation technique and an environment which stores and reuses extraction procedures. A designer can easily develop an extraction procedure for a new MOSFET model by modifying a procedure for another MOSFET model developed previously. We have verified that the system is suitable for major SPICE models.