A Time Domain Reflectometry Using Envelope Extraction and Its Application to Measurement of Stripline Resonator Characteristics

Tatsuya OMORI  Ken'ichiro YASHIRO  Sumio OHKAWA  

IEICE TRANSACTIONS on Electronics   Vol.E77-C   No.6   pp.908-912
Publication Date: 1994/06/25
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
TDR,  resonator characterization,  deconvolution,  envelope extraction,  

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A kind of time domain reflectometry using deconvolution and envelope extraction process is presented for measuring microwave resonator characteristics, where data acquisition and data processing are performed entirely in the time domain. The proposed method may be used to characterize resonators which have Q values in the range between a few dozen and several hundred. The major drawback of the time domain measurement techniques is in general considered to be a low frequency resolution. In the proposed method, it is avoided skillfully.