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An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz
Akira NAKAYAMA Kazuya SHIMIZU
IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Microwave and Millimeter Wave Technology
measurement of complex permittivity, reflection wave method, MHz-GHz range, frequency dependence,
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An improved reflection wave method was described for measurement of complex permittivity of low-loss materials over 100MHz-1GHz range. The residual impedance Zr and stray admittance Ys surrounding the test sample, which terminated the transmission line, were evaluated using sapphire as a reference material. The correction by the obtained Zr and Ys gave accurate values of complex permittivities of alumina and mullite ceramics as 100MHz-1GHz.