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Two-Pattern Test Capabilities of Autonomous TGP Circuits
Kiyoshi FURUYA Edward J. McCLUSKEY
IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
two-pattern testing, built-in self-test, TPG circuit, linear sequential circuit, transition coverage,
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A method to analyze two-pattern test capabilities of autonomous test pattern generator (TPG) circuits for use in built-in self-testing are described. The TPG circuits considered here include arbitrary autonomous linear sequential circuits in which outputs are directly fed out from delay elements. Based on the transition matrix of a circuit, it is shown that the number of distinct transitions in a subspace of state variables can be obtained from rank of the submatrix. The two-pattern test capabilities of LFSRs, cellular automata, and their fast parallel implementation are investigated using the transition coverage as a metric. The relationships with dual circuits and reciprocal circuits are also mentioned.