Two-Pattern Test Capabilities of Autonomous TGP Circuits

Kiyoshi FURUYA  Edward J. McCLUSKEY  

IEICE TRANSACTIONS on Information and Systems   Vol.E76-D   No.7   pp.800-808
Publication Date: 1993/07/25
Online ISSN: 
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
two-pattern testing,  built-in self-test,  TPG circuit,  linear sequential circuit,  transition coverage,  

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A method to analyze two-pattern test capabilities of autonomous test pattern generator (TPG) circuits for use in built-in self-testing are described. The TPG circuits considered here include arbitrary autonomous linear sequential circuits in which outputs are directly fed out from delay elements. Based on the transition matrix of a circuit, it is shown that the number of distinct transitions in a subspace of state variables can be obtained from rank of the submatrix. The two-pattern test capabilities of LFSRs, cellular automata, and their fast parallel implementation are investigated using the transition coverage as a metric. The relationships with dual circuits and reciprocal circuits are also mentioned.