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Investigation on the Possible Electric Field Effect and Surface Morphology of a YBCO/CeO2/Au MIS Diode
Qian WANG Ienari IGUCHI
IEICE TRANSACTIONS on Electronics
Publication Date: 1993/08/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on High-Temperature Superconducting Electronics)
MIS diode, electric field effect, high Tc superconductor, CeO2, surface morphology,
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A YBCO/CeO2/Au MIS structure (YBCO:YBa2Cu3O7y) is fabricated on a MgO(100) substrate with the help of the all-in-situ electron-beam and heater coevaperation system. The current-voltage (I-V) characteristics of the deposited YBCO film under various gate voltages are examined. Small modulation of the I-V characteristics by gate voltages can be observed. Meanwhile, the surface morphology is also studied by means of an atomic force microscope (AFM). The relation between the field effect and the surface morphology of a thin YBCO film is discussed.