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Characterization of Microstrip Lines Near Edge of Dielectric Substrate with Rectangular Boundary Division Method
Keren LI Kazuhiko ATSUKI Hitoshi YAJIMA Eikichi YAMASHITA
IEICE TRANSACTIONS on Electronics
Publication Date: 1993/06/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functions and Size-Reductions)
microstrip line, finite-width of substrate, Fourier series, spline function, substrate edge,
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In this paper, the characteristics of microstrip lines near the edge of dielectric substrate are analyzed by improving the rectangular boundary division method. The numerical results indicate the changes of the characteristics of a microstrip line when the strip conductor is closely located to the edge. When the distance the dielectric substrate edge to the strip conductor is less than the thickness of dielectric substrate, the effects of the edge on the line characteristics are no longer negligible. The numerical results in this paper show high computation accuracy without increasing computation time. Our improvement is effective for the analysis of the microstrip lines both for the narrow strip conductor and the strip conductor close to the edge. The relative errors between the numerical results and the measured values are less than 1.2%.