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A Smart Design Methodology with Distributed Extra Gate-Arrays for Advanced ULSI Memories
Masaki TSUKUDA Kazutami ARIMOTO Mikio ASAKURA Hideto HIDAKA Kazuyasu FUJISHIMA
IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on LSI Memories)
reduction of design TAT, design methodology, ULSI memory,
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We propose a smart design methodology for advanced ULSI memories to reduce the turn around time(TAT) for circuit revisions with no area penalty. This methodology was executed by distributing extra gate-arrays, which were composed of the n-channel and p-channel transistors, under the power line and the signal line. This method was applied to the development of a 16 Mb DRAM with double metal wiring. The design TAT can be reduced to 1/8 using 1500 gates. This design methodology has been confirmed to be very effective.