A Switching Closure Test to Analyze Cryptosystems

Hikaru MORITA  Kazuo OHTA  

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E75-A   No.4   pp.498-503
Publication Date: 1992/04/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Issue on Discrete Mathematics and Its Application)
Category: 
Keyword: 
cryptosystem,  group,  closure test,  meet-in-the-middle technique,  DES cipher,  RSA scheme,  birth-day paradox,  

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Summary: 
A closure test MCT (meet-in-the-middle closure test) has been introduced to analyze the algebraic properties of cryptosystems. Since MCT needs a large amount of memory, it is hard to implement with an ordinary meet-in-the-middle method. As a feasible version of MCT, this paper presents a switching closure test SCT based on a new memoryless meet-in-the-middle method. To achieve the memoryless method, appropriate techniques, such as expansion of cycling detection methods for one function into a method for two functions and an efficient intersection search method that uses only a small amount of memory, are effectively used.