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A Switching Closure Test to Analyze Cryptosystems
Hikaru MORITA Kazuo OHTA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1992/04/25
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Issue on Discrete Mathematics and Its Application)
cryptosystem, group, closure test, meet-in-the-middle technique, DES cipher, RSA scheme, birth-day paradox,
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A closure test MCT (meet-in-the-middle closure test) has been introduced to analyze the algebraic properties of cryptosystems. Since MCT needs a large amount of memory, it is hard to implement with an ordinary meet-in-the-middle method. As a feasible version of MCT, this paper presents a switching closure test SCT based on a new memoryless meet-in-the-middle method. To achieve the memoryless method, appropriate techniques, such as expansion of cycling detection methods for one function into a method for two functions and an efficient intersection search method that uses only a small amount of memory, are effectively used.