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The Impact Ionization Calculated by Monte Carlo Technique
Masayoshi SHIRAHATA Norihiko KOTANI Yoichi AKASAKA
IEICE TRANSACTIONS on Electronics
Publication Date: 1991/06/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Device and Process Simulation for Ultra Large Scale Integration)
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We investigated the limit of applicability of the impact ionization model as a function of the local electric field by using of the Monte Carlo technique. We found out that the deviation between the Monte Carlo result and estimation of the model of the local electric field becomes significant where the field-gradient is high and for our electric field profile it is about 1.0 1010 V/cm2. We also calculated the substrate current by the regional Monte Carlo calculation. We proposed an absorbent boundary at the end of the calculation region to reduce the computational time. Computational time is greatly reduced and the result is the same as that calculated by the conventional boundary.