Michelson Interferometric Measurement of Frequency Deviation of a Directly Modulated Semiconductor Laser

Masaaki IMAI  Koji KAWAKITA  Yoshihiro OHTSUKA  

IEICE TRANSACTIONS (1976-1990)   Vol.E71   No.4   pp.345-347
Publication Date: 1988/04/25
Online ISSN: 
Print ISSN: 0000-0000
Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1988 Spring Convention IEICE)
Category: Optical Measurement

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An interferometric method for measuring frequency deviation of semiconductor lasers in wide range of modulation frequencies has been developed. Fringe visibilities of an interfered IM- and FM-modulated light depend on frequency deviation, time delay difference and intensity modulation depth. The applicability of this method has been also discussed.