Influence of Induced Noise Caused by Breaking Electric Contacts on Digital Circuits

Keiichi UCHIMURA  Junji MICHIDA  Shinji NOZU  Teizo AIDA  Hiroshi ECHIGO  Tasuku TAKAGI  

IEICE TRANSACTIONS (1976-1990)   Vol.E70   No.4   pp.370-372
Publication Date: 1987/04/25
Online ISSN: 
Print ISSN: 0000-0000
Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1987 National Convention IEICE)
Category: Instrumentation and Electronic Circuits

Full Text: PDF>>
Buy this Article

This letter deals with a newly developed automatic system, which measures the rate of malfunction of digital circuits owing to noise induced by breaking electric contacts. In this system, a personal computer is used for the detection and the count of the malfunction in the digital circuit. Its experimental results are reported here.