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Influence of Induced Noise Caused by Breaking Electric Contacts on Digital Circuits
Keiichi UCHIMURA Junji MICHIDA Shinji NOZU Teizo AIDA Hiroshi ECHIGO Tasuku TAKAGI
IEICE TRANSACTIONS (1976-1990)
Publication Date: 1987/04/25
Print ISSN: 0000-0000
Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1987 National Convention IEICE)
Category: Instrumentation and Electronic Circuits
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This letter deals with a newly developed automatic system, which measures the rate of malfunction of digital circuits owing to noise induced by breaking electric contacts. In this system, a personal computer is used for the detection and the count of the malfunction in the digital circuit. Its experimental results are reported here.