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Structural Study of ZnSe-ZnTe Strained Layer Superlattice on InP Substrate Prepared by MBE
Hironori KATAGIRI Masakazu KOBAYASHI Naoki MINO Kazuyori URABE Makoto KONAGAI Kiyoshi TAKAHASHI
IEICE TRANSACTIONS (1976-1990)
Publication Date: 1986/04/25
Print ISSN: 0000-0000
Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1986 National Convention IECE Japan)
Category: Compound Semiconductor Devices
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Direct observation of ZnSe-ZnTe strained layer superlattice was performed by Transmission Electron Microscopy for the first time. The long periodicity of the superlattice was confirmed by the satellite spots of Transmission Electron Diffraction. The bright field TEM image directly indicated the superlattice structure without large scale misfit dislocations.