Structural Study of ZnSe-ZnTe Strained Layer Superlattice on InP Substrate Prepared by MBE

Hironori KATAGIRI  Masakazu KOBAYASHI  Naoki MINO  Kazuyori URABE  Makoto KONAGAI  Kiyoshi TAKAHASHI  

Publication
IEICE TRANSACTIONS (1976-1990)   Vol.E69   No.4   pp.277-278
Publication Date: 1986/04/25
Online ISSN: 
DOI: 
Print ISSN: 0000-0000
Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1986 National Convention IECE Japan)
Category: Compound Semiconductor Devices
Keyword: 


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Summary: 
Direct observation of ZnSe-ZnTe strained layer superlattice was performed by Transmission Electron Microscopy for the first time. The long periodicity of the superlattice was confirmed by the satellite spots of Transmission Electron Diffraction. The bright field TEM image directly indicated the superlattice structure without large scale misfit dislocations.