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On-Chip Testing for 30 K-Gate Masterslice
Shinji SATO Hiromasa TAKAHASHI Yasuhide MACHIDA Gensuke GOTO
IEICE TRANSACTIONS (1976-1990)
Publication Date: 1986/04/25
Print ISSN: 0000-0000
Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1986 National Convention IECE Japan)
Category: Silicon Devices and Integrated Circuits
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On-chip testing for 30 K-gate masterslice with freely configured SRAM AND/OR ROM blocks was investigated. Multiplier fault coverage was about 93 percent. The validity of on-chip testing was confirmed in masterslices containing over 20 K gates with memory blocks.