FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST

Hanan T. Al-AWADHI  Tomoki AONO  Senling WANG  Yoshinobu HIGAMI  Hiroshi TAKAHASHI  Hiroyuki IWATA  Yoichi MAEDA  Jun MATSUSHIMA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E103-D   No.11   pp.2289-2301
Publication Date: 2020/11/01
Publicized: 2020/08/20
Online ISSN: 1745-1361
DOI: 10.1587/transinf.2019EDP7235
Type of Manuscript: PAPER
Category: Dependable Computing
Keyword: 
POST,  BIST,  Multi-Cycle Test,  Fault detection degradation,  FF-Control Point Insertion technique,  FF selection,  

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Summary: 
Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST.