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Identification and Sensing of Wear Debris Caused by Fretting Wear of Electrical Connectors
Yanyan LUO Zhaopan ZHANG Xiongwei WU Jingyuan SU
IEICE TRANSACTIONS on Electronics
Publication Date: 2020/05/01
Online ISSN: 1745-1353
Type of Manuscript: PAPER
Category: Electromechanical Devices and Components
electrical connectors, wear debris, electrical capacitance tomography, SEM, EDS,
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An electrical capacitance tomography (ECT) method was used to detect fretting wear behavior of electrical connectors. The specimens used in this study were contacts of type-M round two-pin electrical connectors. The experiments consisted of running a series of vibration tests at each frequency combined with one g levels. During each test run, the measured capacitance per pair of electrodes was monitored as a performance characteristic, which is induced by the wear debris generated by the fretting wear of electrical connectors. The fretted surface is examined using scanning electron microscopy (SEM) and energy dispersive spectrometer (EDS) analysis to assess the surface profile, extent of fretting damage and elemental distribution across the contact zone and then compared to the capacitance values. The results exhibit that with the increase of the fretting cycles or the vibration frequency, the characteristic value of the wear debris between the contacts of electrical connector gradually increases and the wear is more serious. Measured capacitance values are consistent with SEM and EDS analysis.