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Experimental Validation of Conifer and Broad-Leaf Tree Classification Using High Resolution PolSAR Data above X-Band
Yoshio YAMAGUCHI Yuto MINETANI Maito UMEMURA Hiroyoshi YAMADA
IEICE TRANSACTIONS on Communications
Publication Date: 2019/07/01
Online ISSN: 1745-1345
Type of Manuscript: PAPER
Category: Antennas and Propagation
polarimetry, scattering power decomposition, eigenvalue decomposition, conifer, broad-leaf tree,
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This paper presents a conifer and broad-leaf tree classification scheme that processes high resolution polarimetric synthetic aperture data above X-band. To validate the proposal, fully polarimetric measurements are conducted in a precisely controlled environment to examine the difference between the scattering mechanisms of conifer and broad-leaf trees at 15GHz. With 3.75cm range resolution, scattering matrices of two tree types were measured by a vector network analyzer. Polarimetric analyses using the 4-component scattering power decomposition and alpha-bar angle of eigenvalue decomposition yielded clear distinction between the two tree types. This scheme was also applied to an X-band Pi-SAR2 data set. The results confirm that it is possible to distinguish between tree types using fully polarimetric and high-resolution data above X-band.