Experimental Validation of Conifer and Broad-Leaf Tree Classification Using High Resolution PolSAR Data above X-Band

Yoshio YAMAGUCHI  Yuto MINETANI  Maito UMEMURA  Hiroyoshi YAMADA  

Publication
IEICE TRANSACTIONS on Communications   Vol.E102-B   No.7   pp.1345-1350
Publication Date: 2019/07/01
Online ISSN: 1745-1345
DOI: 10.1587/transcom.2018EBP3288
Type of Manuscript: PAPER
Category: Antennas and Propagation
Keyword: 
polarimetry,  scattering power decomposition,  eigenvalue decomposition,  conifer,  broad-leaf tree,  

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Summary: 
This paper presents a conifer and broad-leaf tree classification scheme that processes high resolution polarimetric synthetic aperture data above X-band. To validate the proposal, fully polarimetric measurements are conducted in a precisely controlled environment to examine the difference between the scattering mechanisms of conifer and broad-leaf trees at 15GHz. With 3.75cm range resolution, scattering matrices of two tree types were measured by a vector network analyzer. Polarimetric analyses using the 4-component scattering power decomposition and alpha-bar angle of eigenvalue decomposition yielded clear distinction between the two tree types. This scheme was also applied to an X-band Pi-SAR2 data set. The results confirm that it is possible to distinguish between tree types using fully polarimetric and high-resolution data above X-band.