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Density Optimization for Analog Layout Based on Transistor-Array
Chao GENG Bo LIU Shigetoshi NAKATAKE
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2019/12/01
Online ISSN: 1745-1337
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
analog layout, manufacturability, layout density, transistor-array,
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In integrated circuit design of advanced technology nodes, layout density uniformity significantly influences the manufacturability due to the CMP variability. In analog design, especially, designers are suffering from passing the density checking since there are few useful tools. To tackle this issue, we focus a transistor-array(TA)-style analog layout, and propose a density optimization algorithm consistent with complicated design rules. Based on TA-style, we introduce a density-aware layout format to explicitly control the layout pattern density, and provide the mathematical optimization approach. Hence, a design flow incorporating our density optimization can drastically reduce the design time with fewer iterations. In a design case of an OPAMP layout in a 65nm CMOS process, the result demonstrates that the proposed approach achieves more than 48× speed-up compared with conventional manual layout, meanwhile it shows a good circuit performance in the post-layout simulation.