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Sheared EPI Analysis for Disparity Estimation from Light Fields
Takahiro SUZUKI Keita TAKAHASHI Toshiaki FUJII
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2017/09/01
Online ISSN: 1745-1361
Type of Manuscript: Special Section PAPER (Special Section on Picture Coding and Image Media Processing)
epipolar plane image, light fields, disparity estimation,
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Structure tensor analysis on epipolar plane images (EPIs) is a successful approach to estimate disparity from a light field, i.e. a dense set of multi-view images. However, the disparity range allowable for the light field is limited because the estimation becomes less accurate as the range of disparities become larger. To overcome this limitation, we developed a new method called sheared EPI analysis, where EPIs are sheared before the structure tensor analysis. The results of analysis obtained with different shear values are integrated into a final disparity map through a smoothing process, which is the key idea of our method. In this paper, we closely investigate the performance of sheared EPI analysis and demonstrate the effectiveness of the smoothing process by extensively evaluating the proposed method with 15 datasets that have large disparity ranges.