Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines

Hiroyuki YOTSUYANAGI  Kotaro ISE  Masaki HASHIZUME  Yoshinobu HIGAMI  Hiroshi TAKAHASHI  

IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E100-A   No.12   pp.2842-2850
Publication Date: 2017/12/01
Online ISSN: 1745-1337
DOI: 10.1587/transfun.E100.A.2842
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
resistive open,  small delay fault,  adjacent line,  delay variation,  anomaly detection,  

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Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.