Keyword : within-die variability


Variability: Modeling and Its Impact on Design
Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C  No. 3 ; pp. 342-348
Type of Manuscript:  INVITED PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: 
Keyword: 
variabilitywithin-die variabilitydie-to-die variabilitystatistical design
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