Keyword : wide I/O bus

Diagnosis of Signaling and Power Noise Using In-Place Waveform Capturing for 3D Chip Stacking
Satoshi TAKAYA Hiroaki IKEDA Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/06/01
Vol. E97-C  No. 6 ; pp. 557-565
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
wide I/O busthrough silicon viasignal integritypower integrity
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