Keyword : via


A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
Yuta YAMATO Yusuke NAKAMURA Kohei MIYASE Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 667-674
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
fault diagnosisX-fault modelper-testvia
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