Keyword : via distribution


Statistical Modeling of a Via Distribution for Yield Estimation
Takumi UEZONO Kenichi OKADA Kazuya MASU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Vol. E89-A  No. 12 ; pp. 3579-3584
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Interconnect
Keyword: 
via distributionyield estimationwire length distribution
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