Keyword : variation

Study on Threshold Voltage Variation Evaluated by Charge-Based Capacitance Measurement
Katsuhiro TSUJI Kazuo TERADA Ryo TAKEDA Hisato FUJISAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/04/01
Vol. E99-C  No. 4 ; pp. 466-473
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFET, C-V curve, CBCM, threshold voltage, flat-band voltage, variation, 
 Summary | Full Text:PDF
An Approach for Reducing Leakage Current Variation due to Manufacturing Variability
Tsuyoshi SAKATA Takaaki OKUMURA Atsushi KUROKAWA Hidenari NAKASHIMA Hiroo MASUDA Takashi SATO Masanori HASHIMOTO Koutaro HACHIYA Katsuhiro FURUKAWA Masakazu TANAKA Hiroshi TAKAFUJI Toshiki KANAMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12 ; pp. 3016-3023
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
low power, leakage, gate delay model, variation, 
 Summary | Full Text:PDF
A 1-V MTCMOS Circuit Hardened to Temperature-Dependent Delay-Time Variation
Takakuni DOUSEKI Shin-ichiro MUTOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/08/25
Vol. E79-C  No. 8 ; pp. 1131-1136
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
delay-time, temperature, variation, 1-volt, multithreshold, CMOS, 
 Summary | Full Text:PDF