| Keyword : variability
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Development of Test Structure for Variability Evaluation using Charge-Based Capacitance Measurement Katsuhiro TSUJI Kazuo TERADA Ryota KIKUCHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2014/11/01
Vol. E97-C
No. 11 ;
pp. 1117-1123
Type of Manuscript:
PAPER
Category: Semiconductor Materials and Devices Keyword: MOSFET, C-V curve, CBCM, variability, | | Summary | Full Text:PDF | |
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Manufacturability-Aware Design of Standard Cells Hirokazu MUTA Hidetoshi ONODERA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/12/01
Vol. E90-A
No. 12 ;
pp. 2682-2690
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Physical Design Keyword: manufacturability, variability, DFM, ACLV, standard cell, OPC, RET, | | Summary | Full Text:PDF | |
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Statistical Modeling of Device Characteristics with Systematic Variability Kenichi OKADA Hidetoshi ONODERA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/02/01
Vol. E84-A
No. 2 ;
pp. 529-536
Type of Manuscript:
Special Section PAPER (Special Section on Analog Circuit Techniques Supporting the System LSI Era)
Category: Keyword: MOSFET, variability, systematic, stochastic, | | Summary | Full Text:PDF | |
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