Keyword : universal test


Universal Testing for Linear Feed-Forward/Feedback Shift Registers
Hideo FUJIWARA Katsuya FUJIWARA Toshinori HOSOKAWA 
Publication:   
Publication Date: 2020/05/01
Vol. E103-D  No. 5 ; pp. 1023-1030
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
linear feed-forward shift registerslinear feedback shift registerstest generationsequential logicuniversal testbuilt-in self-testsecure scan design
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