Keyword : trap

Evaluation of Surface States of AlGaN/GaN HFET Using Open-Gated Structure
Daigo KIKUTA Jin-Ping AO Yasuo OHNO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4 ; pp. 683-689
Type of Manuscript:  Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Compound Semiconductor Devices
Keyword: 
device simulation, open-gated FET, AlGaN/GaN heterostructure, trap, surface state, interface state, 
 Summary | Full Text:PDF(550.1KB)
On Liveness of Extended Partially Ordered Condition Nets
Atsushi OHTA Kohkichi TSUJI Tomiji HISAMURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/11/25
Vol. E82-A  No. 11 ; pp. 2576-2578
Type of Manuscript:  Special Section LETTER (Special Section on Concurrent Systems Technology)
Category: 
Keyword: 
Petri net, liveness, siphon, trap, 
 Summary | Full Text:PDF(126.3KB)
Individual Carrier Traps in GaAs/AlxGa1-xAs Heterostructures
Toshitsugu SAKAMOTO Yasunobu NAKAMURA Kazuo NAKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/11/25
Vol. E79-C  No. 11 ; pp. 1590-1595
Type of Manuscript:  Special Section PAPER (Special Issue on Quantum Effect Devices and Their Fabrication Technologies)
Category: 
Keyword: 
trap, random telegraph signal, position, GaAs/AlxGa1-xAs, 
 Summary | Full Text:PDF(583.5KB)