Keyword : transition faults

A Don't Care Filling Method for Low Capture Power based on Correlation of FF Transitions Using SAT
Masayoshi YOSHIMURA Yoshiyasu TAKAHASHI Hiroshi YAMAZAKI Toshinori HOSOKAWA 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12 ; pp. 2824-2833
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
transition faults, correlation, capture power reduction, X-filling, SAT, 
 Summary | Full Text:PDF(1.8MB)
Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests
Hiroshi IWATA Nanami KATAYAMA Ken'ichi YAMAGUCHI 
Publication:   
Publication Date: 2017/06/01
Vol. E100-D  No. 6 ; pp. 1182-1189
Type of Manuscript:  Special Section PAPER (Special Section on Formal Approach)
Category: Formal techniques
Keyword: 
redundancy identification, transition faults, broadside scan test, formal verification and functional equivalence, 
 Summary | Full Text:PDF(651.8KB)
Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool
Yoshinobu HIGAMI Satoshi OHNO Hironori YAMAOKA Hiroshi TAKAHASHI Yoshihiro SHIMIZU Takashi AIKYO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/04/01
Vol. E95-D  No. 4 ; pp. 1093-1100
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
fault diagnosis, test generation, transition faults, stuck-at ATPG, 
 Summary | Full Text:PDF(502.5KB)