Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/10/01
Vol. E97-D
No. 10 ;
pp. 2706-2718
Type of Manuscript:
PAPER
Category: Dependable Computing
Keyword:
at-speed scan-based logic BIST, capture power safety, masking, IR-drop, transition delay fault, long sensitized path, |
