Keyword : transition coverage


Coverage Estimation Using Transition Perturbation for Symbolic Model Checking in Hardware Verification
Xingwen XU Shinji KIMURA Kazunari HORIKAWA Takehiko TSUCHIYA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Vol. E89-A  No. 12 ; pp. 3451-3457
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Simulation and Verification
Keyword: 
model checkingtransition coverage
 Summary | Full Text:PDF

Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing
Kiyoshi FURUYA Susumu YAMAZAKI Masayuki SATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7 ; pp. 889-894
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
built-in self-test (BIST)two-pattern testfault coveragetransition coverage
 Summary | Full Text:PDF

Design of Autonomous TPG Circuits for Use in Two-Pattern Testing
Kiyoshi FURUYA Seiji SEKI Edward J. McCLUSKEY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7 ; pp. 882-888
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
built-in self-test (BIST)two-pattern testpseudorandom pattern generatorautonomous linear sequential circuittransition coverage
 Summary | Full Text:PDF

Two-Pattern Test Capabilities of Autonomous TGP Circuits
Kiyoshi FURUYA Edward J. McCLUSKEY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 800-808
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
two-pattern testingbuilt-in self-testTPG circuitlinear sequential circuittransition coverage
 Summary | Full Text:PDF