Keyword : transistor short


Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
Yoshinobu HIGAMI Kewal K. SALUJA Hiroshi TAKAHASHI Shin-ya KOBAYASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 690-699
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
transistor shortfault simulationtest generationstuck-at test tool
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