Keyword : time measurement

A CMOS Time-to-Digital Converter LSI with Half-Nanosecond Resolution Using a Ring Gate Delay Line
Takamoto WATANABE Yasuaki MAKINO Yoshinori OHTSUKA Shigeyuki AKITA Tadashi HATTORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/12/25
Vol. E76-C  No. 12 ; pp. 1774-1779
Type of Manuscript:  Special Section PAPER (Special Issue on ASICs for Automotive Electronics)
time measurementgate delayinverterphase comparatorA/D converter
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