Keyword : through-put


A Study on Performance Degradation of Digital Electronic Equipment under Electromagnetic Disturbance
Takehiro TAKAHASHI Hironori OKANIWA Takashi SAKUSABE Noboru SCHIBUYA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2007/06/01
Vol. E90-B  No. 6 ; pp. 1338-1343
Type of Manuscript:  Special Section PAPER (Special Section on 2nd Pan-Pacific EMC Joint Meeting--PPEMC'06--)
Category: Measurement and Immunity
Keyword: 
digital electronic equipmentperformance degradationthrough-putnear field measurementelectromagnetic disturbanceinterference of intra-equipment
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